This volume contains the proceedings of the 12th International Conference on Simulation of Semico...

This book provides readers with a variety of tools to address the challenges posed by hot carrier...

Dear Readers, Since the ground-breaking, Nobel-prize crowned work of Heeger, MacDiarmid, and Shir...

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Re...

This book provides a single-source reference to one of the more challenging reliability issues pl...

Dear Readers, Since the ground-breaking, Nobel-prize crowned work of Heeger, MacDiarmid, and Shir...

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices.R...

This book provides readers with a variety of tools to address the challenges posed by hot carrier...

This book provides readers with a variety of tools to address the challenges posed by hot carrier...

This book provides a single-source reference to one of the more challenging reliability issues pl...

The 'Twelfth International Conference on Simulation of Semiconductor Processes and Devices' (SISP...

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices.R...