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Bias Temperature Instability for Devices and Circuits
Langbeschreibung
This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.
Hauptbeschreibung
Enables readers to understand and model negative bias temperature instability, with an emphasis on dynamics
Inhaltsverzeichnis
Introduction.- Characterization, Experimental Challenges.- Advanced Characterization.- Characterization of Nanoscale Devices.- Statistical Properties/Variability.- Theoretical Understanding.- Possible Defects: Experimental.- Possible Defects: First Principles.- Modeling.- Technological Impact.- Silicon dioxides/SiON.- High-k oxides.- Alternative technologies.- Circuits.
ISBN-13:
9781461479086
Veröffentl:
2013
Erscheinungsdatum:
23.10.2013
Seiten:
824
Autor:
Tibor Grasser
Gewicht:
1534 g
Format:
241x160x47 mm
Sprache:
Englisch
160,49 €*
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