Langbeschreibung
Besides its coverage of the four important aspects of synchrotron sources, materials and material processes, measuring techniques, and applications, this ready reference presents both important method types: diffraction and tomography. Following an introduction, a general section leads on to methods, while further sections are devoted to emerging methods and industrial applications. In this way, the text provides new users of large-scale facilities with easy access to an understanding of both the methods and opportunities offered by different sources and instruments.
Inhaltsverzeichnis
IntroductionI. GENERALMicrostructure and Properties of Engineering MaterialsInternal Stresses in Engineering MaterialsTexture and Texture Analysis in Engineering MaterialsPhysical Properties of Photons and NeutronsRadiation SourcesII. METHODSIntroduction to Methods for Internal Stress AnalysesStress Analysis by Angle Dispersive Neutron DiffractionStress Analysis by Energy Dispersive Neutron DiffractionResidual Stress Analysis by Monochromatic High Energy X-raysResidual Stress Analysis by White High Energy X-raysDiffraction Imaging for Microstructure AnalysisBasics of Small-Angle Scattering MethodsSmall-Angle Neutron ScatteringDecomposition Kinetics in Copper-Cobalt Alloy Systems: Applications of Small-Angle X-ray ScatteringB3 ImagingNeutron and Synchrotron-Radiation-Based Imaging for Applications in Materials Science - From Macro- to Nanotomographym-Tomography of Engineering MaterialsDiffraction Enhanced ImagingIII. NEW AND EMERGING METHODS3D X-ray Microscope3D µ-Resolution LaueQuantitative Analysis of Three-Dimensional Plastic Strain Fields Using Markers and X-ray Absorption TomographyCombined Diffraction and TomographyIV. INDUSTRIAL APPLICATIONSDiffraction-Based Residual Stress Analysis Applied to Problems in the Aircraft IndustryOptimization of Residual Stresses in Crankshafts